Any technique which utilizes the
diffraction of X-rays generated in a microstructural domain of a solid under bombardment with
a finely focused electron beam, thus providing an X-ray
diffraction pattern of this microstructural domain. The pattern can be recorded with a
film either on the reflection or
transmission side of the specimen (in the latter case the crystalline sample has to be a
thin film or a small particle).
Source:
PAC, 1983, 55, 2023
(Nomenclature, symbols and units recommended for in situ microanalysis (Provisional))
on page 2025
Cite as:
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by
A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997).
XML on-line corrected version: http://goldbook.iupac.org (2006-) created by M. Nic,
J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8.
https://doi.org/10.1351/goldbook.
