interfacial layer width,
in thin films
The
characteristic length
defined by the variance of the Gaussian function fitted to the
gradient
of the
electron density
profile established by X-ray specular
reflectivity
studies of the liquid
interface
.
Source:
PAC, 1994,
66
, 1667
(Thin films including layers: terminology in relation to their preparation and characterization (IUPAC Recommendations 1994))
on page 1674
