The distance between the 84 and 16 per cent levels of the
depth profile of an element in a perfect sandwich sample with an infinitesimally small overlap
of the components. These limits correspond to the 2
-value of the Gaussian distribution of the signal at the
interface.
Source:
PAC, 1979, 51, 2243
(General aspects of trace analytical methods - IV. Recommendations for nomenclature,
standard procedures and reporting of experimental data for surface analysis techniques)
on page 2247