Any technique in which an electron transparent sample is bombarded with an electron
beam and the intensity of the transmitted electrons which is determined by
scattering phenomena (electron absorption phenomena) in the interior of the sample is recorded.
TEM essentially provides a high resolution image of the microstructure of a thin sample.
This technique is often just called
electron microscopy. The term
transmissionelectron microscopy is however recommended for the sake of a clear distinction from other electron microscopic
techniques.
Source:
PAC, 1983, 55, 2023
(Nomenclature, symbols and units recommended for in situ microanalysis (Provisional))
on page 2024
Cite as:
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by
A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997).
XML on-line corrected version: http://goldbook.iupac.org (2006-) created by M. Nic,
J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8.
https://doi.org/10.1351/goldbook.